Current instability in GaAs n+-i-n+ structures as a limitation of the maximum drain voltage of power MESFETs
V.A. Vashchenko, J.B. Martynov, V.F. Sinkevitch, A.S. TagerVolume:
39
Year:
1996
Language:
english
Pages:
5
DOI:
10.1016/0038-1101(95)00400-9
File:
PDF, 468 KB
english, 1996