Measurement and modeling of thin-film accumulation-mode SOI...

Solid-State Electronics 1996 Vol. 39; Iss. 7

Measurement and modeling of thin-film accumulation-mode SOI p-MOSFET intrinsic gate capacitances

B. Gentinne, D. Flandre, J.-P. Colinge
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Volume:
39
Year:
1996
Language:
english
Pages:
8
DOI:
10.1016/0038-1101(95)00408-4
File:
PDF, 791 KB
english, 1996
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