Soft X-ray photoelectron microscopy used for the...

Diamond and Related Materials 2002 / 3 Vol. 11; Iss. 3-6

Soft X-ray photoelectron microscopy used for the characterization of diamond, a-C and CNx, thin films

Ziethen, Ch., Wegelin, F., Schönhense, G., Ohr, R., Neuhäuser, M., Hilgers, H.
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Volume:
11
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(01)00597-0
Date:
March, 2002
File:
PDF, 886 KB
english, 2002
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