A New Model for Light-induced Degradation by B-O Defects in...

Energy Procedia 2013 Vol. 38

A New Model for Light-induced Degradation by B-O Defects in p- and n-type Silicon

Fraser, Keith, Blanc-Pelissier, Daniele, Dubois, Sebastien, Veirman, Jordi, Tanay, Florent, Lemiti, Mustapha
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Volume:
38
Year:
2013
Language:
english
Journal:
Energy Procedia
DOI:
10.1016/j.egypro.2013.07.315
File:
PDF, 316 KB
english, 2013
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