On the impact of Ag doping on performance and reliability...

Solid-State Electronics 2013 / 6 Vol. 84

On the impact of Ag doping on performance and reliability of GeS2-based conductive bridge memories

Longnos, F., Vianello, E., Cagli, C., Molas, G., Souchier, E., Blaise, P., Carabasse, C., Rodriguez, G., Jousseaume, V., De Salvo, B., Dahmani, F., Verrier, P., Bretegnier, D., Liebault, J.
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Volume:
84
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.02.013
Date:
June, 2013
File:
PDF, 1.50 MB
english, 2013
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