Phase retrieval technology for off-axis ellipsoid surface test with a high dynamic range algorithm
Xie, Chao, Li, Shengyi, Ding, Linyan, Chen, ShangyongVolume:
124
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2012.09.026
Date:
September, 2013
File:
PDF, 1.34 MB
english, 2013