Phase retrieval technology for off-axis ellipsoid surface...

Phase retrieval technology for off-axis ellipsoid surface test with a high dynamic range algorithm

Xie, Chao, Li, Shengyi, Ding, Linyan, Chen, Shangyong
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Volume:
124
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2012.09.026
Date:
September, 2013
File:
PDF, 1.34 MB
english, 2013
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