Structural characterization of diamond films grown...

Structural characterization of diamond films grown epitaxially on silicon

Schreck, M., Hessmer, R., Geier, S., Rauschenbach, B., Stritzker, B.
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Volume:
3
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/0925-9635(94)90213-5
Date:
April, 1994
File:
PDF, 786 KB
english, 1994
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