Structural characterization of diamond films grown epitaxially on silicon
Schreck, M., Hessmer, R., Geier, S., Rauschenbach, B., Stritzker, B.Volume:
3
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/0925-9635(94)90213-5
Date:
April, 1994
File:
PDF, 786 KB
english, 1994