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Structural investigations of SiGe epitaxial layers grown by molecular beam epitaxy on Si(001) and Ge(001) substrates: II—Transmission electron microscopy and atomic force microscopy
Faleev, N., Sustersic, N., Bhargava, N., Kolodzey, J., Magonov, S., Smith, D.J., Honsberg, C.Volume:
365
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2012.11.067
Date:
February, 2013
File:
PDF, 1.28 MB
english, 2013