Retraction notice to “A Probability Model of Covering Key Trace during Capturing Volatile Memory” Procedia Engineering Volume 29, 2012, Pages 1253–1258
Wang, Lianhai, Li, Hengjian, Su, ZhenVolume:
29
Year:
2012
Language:
english
Journal:
Procedia Engineering
DOI:
10.1016/j.proeng.2013.02.211
File:
PDF, 34 KB
english, 2012