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Automated Scanning Tunneling Microscope image analysis of Si (100):H 2×1 surfaces
Randall, J.N., Von Ehr, J.R., Ballard, J.B., Owen, J.H.G., Fuchs, E.Volume:
98
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2012.07.021
Date:
October, 2012
File:
PDF, 685 KB
english, 2012