XPS structural characterization of Pd/SiO2 catalysts...

Applied Surface Science 2013 / 12 Vol. 287

XPS structural characterization of Pd/SiO2 catalysts prepared by cogelation

Beketov, G., Heinrichs, B., Pirard, J.-P., Chenakin, S., Kruse, N.
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Volume:
287
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2013.09.145
Date:
December, 2013
File:
PDF, 1.21 MB
english, 2013
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