Mapping of extended defects in B-doped (001) homoepitaxial...

Diamond and Related Materials 2008 / 4 Vol. 17; Iss. 4-5

Mapping of extended defects in B-doped (001) homoepitaxial diamond films by electron-beam-induced current (EBIC) and cathodoluminescence (CL) combination technique

Ri, Sung-Gi, Yuan, Xiao Li, Sekiguchi, Takashi, Tokuda, Norio, Ogura, Masahiko, Okushi, Hideyo, Yamasaki, Satoshi
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Volume:
17
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/j.diamond.2007.12.060
Date:
April, 2008
File:
PDF, 696 KB
english, 2008
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