Resonant photoemission at the O1s threshold to characterize...

Thin Solid Films 2014 / 03 Vol. 555

Resonant photoemission at the O1s threshold to characterize In2O3 single crystals

Haeberle, Jörg, Richter, Matthias, Galazka, Zbigniew, Janowitz, Christoph, Schmeißer, Dieter
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Volume:
555
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.03.036
Date:
March, 2014
File:
PDF, 410 KB
english, 2014
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