Analysis of smearing-out in contribution plot based fault...

Chemical Engineering Science 2013 / 12 Vol. 104

Analysis of smearing-out in contribution plot based fault isolation for Statistical Process Control

Van den Kerkhof, Pieter, Vanlaer, Jef, Gins, Geert, Van Impe, Jan F.M.
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Volume:
104
Language:
english
Journal:
Chemical Engineering Science
DOI:
10.1016/j.ces.2013.08.007
Date:
December, 2013
File:
PDF, 460 KB
english, 2013
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