Multiple view image analysis of freefalling U.S. wheat...

Computers and Electronics in Agriculture 2013 / 10 Vol. 98

Multiple view image analysis of freefalling U.S. wheat grains for damage assessment

Delwiche, Stephen R., Yang, I-Chang, Graybosch, Robert A.
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Volume:
98
Language:
english
Journal:
Computers and Electronics in Agriculture
DOI:
10.1016/j.compag.2013.07.002
Date:
October, 2013
File:
PDF, 1.33 MB
english, 2013
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