CoSi2 ultra-thin layer formation kinetics and texture from...

Thin Solid Films 2013 / 08 Vol. 541

CoSi2 ultra-thin layer formation kinetics and texture from X-ray diffraction

Delattre, R., Simola, R., Rivero, C., Serradeil, V., Perrin-Pellegrino, C., Thomas, O.
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Volume:
541
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2012.10.128
Date:
August, 2013
File:
PDF, 1011 KB
english, 2013
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