An ultrahigh vacuum system for ion-induced characteristic...

An ultrahigh vacuum system for ion-induced characteristic X-ray analysis

Wendland Beezhold
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Volume:
19
Year:
1973
Language:
english
Pages:
11
DOI:
10.1016/0040-6090(73)90075-8
File:
PDF, 1017 KB
english, 1973
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