Determination of film thickness and refractive index of...

Determination of film thickness and refractive index of films and substrates by means of angular modulation in reflection

A. Konova, M. Borissov, K. Daskalov
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Volume:
27
Year:
1975
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(75)90008-5
File:
PDF, 231 KB
english, 1975
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