Influence of ion bombardment on depth resolution in Auger...

Thin Solid Films 1976 Vol. 38; Iss. 3

Influence of ion bombardment on depth resolution in Auger electron spectroscopy analysis of thin gold films on nickel

H.J. Mathieu, D.E. McClure, D. Landolt
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Volume:
38
Year:
1976
Language:
english
Pages:
14
DOI:
10.1016/0040-6090(76)90007-9
File:
PDF, 1.65 MB
english, 1976
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