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Ion backscattering and electron microscopy analyses of multi-layer metal-PbxSn1-xTe epitaxial film structures obtained by radio frequency sputtering
C. Corsi, S.U. Campisano, G. Foti, E. Rimini, G. VitaliVolume:
32
Year:
1976
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(76)90321-7
File:
PDF, 744 KB
english, 1976