In situ X-ray diffractometry of evaporated thin films:...

Thin Solid Films 1976 Vol. 32; Iss. 2

In situ X-ray diffractometry of evaporated thin films: Application to amorphous tellurium

J.C. Malaurent, J. Dixmier
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
32
Year:
1976
Language:
english
DOI:
10.1016/0040-6090(76)90339-4
File:
PDF, 39 KB
english, 1976
Conversion to is in progress
Conversion to is failed