Auger electron spectroscopy depth profiling of Ni/Cr...

Auger electron spectroscopy depth profiling of Ni/Cr multilayers by sputtering with N2+ ions

S. Hofmann, A. Zalar
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Volume:
60
Year:
1979
Language:
english
Pages:
11
DOI:
10.1016/0040-6090(79)90190-1
File:
PDF, 603 KB
english, 1979
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