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Micropipe defects and voids at β-SiC/Si(100) interfaces
Scholz, R., Gösele, U., Niemann, E., Leidich, D., Wischmeyer, F.Volume:
6
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(97)00095-2
Date:
August, 1997
File:
PDF, 805 KB
english, 1997