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X-ray photoelectron spectroscopy characterization of thin flourine-platinum films
J.P. Delrue, A. Hecq, T. RobertVolume:
72
Year:
1980
Language:
english
Pages:
1
DOI:
10.1016/0040-6090(80)90548-9
File:
PDF, 108 KB
english, 1980