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Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry
C.R. BrundleVolume:
72
Year:
1980
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(80)90552-0
File:
PDF, 441 KB
english, 1980