Impact of duty factor, stress stimuli, gate and drive...

Microprocessors and Microsystems 2013 / 11 Vol. 37; Iss. 8

Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model

Kükner, Halil, Weckx, Pieter, Raghavan, Praveen, Kaczer, Ben, Catthoor, Francky, Van der Perre, Liesbet, Lauwereins, Rudy, Groeseneken, Guido
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Volume:
37
Language:
english
Journal:
Microprocessors and Microsystems
DOI:
10.1016/j.micpro.2013.04.009
Date:
November, 2013
File:
PDF, 1.13 MB
english, 2013
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