Dependence of the resistivity and hall coefficient in thin...

Dependence of the resistivity and hall coefficient in thin metallic films on the thickness and the transverse magnetic field

C.R. Pichard, A.J. Tosser, C.R. Tellier
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Volume:
81
Year:
1981
Language:
english
Pages:
12
DOI:
10.1016/0040-6090(81)90304-7
File:
PDF, 486 KB
english, 1981
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