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Dependence of the resistivity and hall coefficient in thin metallic films on the thickness and the transverse magnetic field
C.R. Pichard, A.J. Tosser, C.R. TellierVolume:
81
Year:
1981
Language:
english
Pages:
12
DOI:
10.1016/0040-6090(81)90304-7
File:
PDF, 486 KB
english, 1981