UV photoelectron spectroscopy of thin films and interfaces between 3 and 50 eV and Auger analysis in the same apparatus using multichannel plates and a low energy diffraction head
M. Priol, J. Peisner, S. RobinVolume:
94
Year:
1982
Language:
english
Pages:
4
DOI:
10.1016/0040-6090(82)90034-7
File:
PDF, 188 KB
english, 1982