A new standardless quantitative electron probe...

A new standardless quantitative electron probe microanalysis technique applied to III–V compound semiconductors

K.P. Zangalis, A. Christou
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Volume:
97
Year:
1982
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(82)90462-x
File:
PDF, 552 KB
english, 1982
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