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Dynamics of metal-SiOx and SiOxSi interfaces and the associated instabilities in practical metal/insulator/semiconductor structures
G. Rajeswaran, W.A. Anderson, M. Jackson, M. ThayerVolume:
104
Year:
1983
Language:
english
Pages:
9
DOI:
10.1016/0040-6090(83)90576-x
File:
PDF, 385 KB
english, 1983