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Microstructure and growth kinetics of CrSi2 on Si{100} studied using cross-sectional transmission electron microscopy
Menachem Natan, S.W. DuncanVolume:
123
Year:
1985
Language:
english
Pages:
17
DOI:
10.1016/0040-6090(85)90042-2
File:
PDF, 1.55 MB
english, 1985