Multilayers deposited by triode sputtering using a new...

Multilayers deposited by triode sputtering using a new accurate method of film thicknesses monitoring

C. Sella, Tran-Khanh-Vien
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Volume:
125
Year:
1985
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(85)90246-9
File:
PDF, 286 KB
english, 1985
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