Measurements on the electrical transport properties in...

Measurements on the electrical transport properties in CoSi2 and NiSi2 formed by thin film reactions

Ch. Krontiras, J. Salmi, L. Grönberg, I. Suni, J. Heleskivi, A. Rissanen
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Volume:
125
Year:
1985
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(85)90400-6
File:
PDF, 461 KB
english, 1985
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