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Measurements on the electrical transport properties in CoSi2 and NiSi2 formed by thin film reactions
Ch. Krontiras, J. Salmi, L. Grönberg, I. Suni, J. Heleskivi, A. RissanenVolume:
125
Year:
1985
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(85)90400-6
File:
PDF, 461 KB
english, 1985