Coverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffraction
M. Pomerantz, A. Segmüller, L. Netzer, J. SagivVolume:
132
Year:
1985
Language:
english
Pages:
10
DOI:
10.1016/0040-6090(85)90466-3
File:
PDF, 723 KB
english, 1985