Structural analysis of an Si/CoSi2/Si heterostructure using...

Structural analysis of an Si/CoSi2/Si heterostructure using ultrahigh resolution transmission electron microscopy

Cécile d'Anterroches, François Arnaud d'Avitaya
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Volume:
137
Year:
1986
Language:
english
Pages:
11
DOI:
10.1016/0040-6090(86)90036-2
File:
PDF, 3.19 MB
english, 1986
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