Structural analysis of an Si/CoSi2/Si heterostructure using ultrahigh resolution transmission electron microscopy
Cécile d'Anterroches, François Arnaud d'AvitayaVolume:
137
Year:
1986
Language:
english
Pages:
11
DOI:
10.1016/0040-6090(86)90036-2
File:
PDF, 3.19 MB
english, 1986