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X-ray photoelectron spectroscopy study of phosphorus incorporation in anodic oxide films on niobium
J. Jouve, Y. Belkacem, C. SeveracVolume:
139
Year:
1986
Language:
english
Pages:
9
DOI:
10.1016/0040-6090(86)90049-0
File:
PDF, 544 KB
english, 1986