Non-destructive determination of free carrier density of epitaxial layers of GaSb by IR reflectivity measurement
S. Schirar, L. Bayo, A. Melouah, J. Bougnot, C. Llinares, A. Montaner, M. GaltierVolume:
155
Year:
1987
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(87)90458-5
File:
PDF, 526 KB
english, 1987