Thermal diffusivity measurement of micron-thick...

Thin Solid Films 1987 Vol. 155; Iss. 1

Thermal diffusivity measurement of micron-thick semiconductor films by mirage detection

J.P. Roger, F. Lepoutre, D. Fournier, A.C. Boccara
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Volume:
155
Year:
1987
Language:
english
Pages:
10
DOI:
10.1016/0040-6090(87)90462-7
File:
PDF, 495 KB
english, 1987
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