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Study of microstructure of amorphous Ge-Se films using spectroscopic ellipsometry
Satyendra Kumar, D.K. Pandya, K.L. ChopraVolume:
164
Year:
1988
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(88)90108-3
File:
PDF, 315 KB
english, 1988