A study of annealing effects on deep level profile...

Thin Solid Films 1988 Vol. 162; Iss. none

A study of annealing effects on deep level profile distributions in GaAs by capacitive methods

A.S. Bhuiyan, A. Martinez, D. Esteve
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Volume:
162
Year:
1988
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(88)90188-5
File:
PDF, 308 KB
english, 1988
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