A comparative Rutherford backscattering spectrometry and...

Thin Solid Films 1988 Vol. 161; Iss. none

A comparative Rutherford backscattering spectrometry and Auger electron spectroscopy depth profile study of Fe-N films

H. De Rugy, J.P. Langeron, S. Bouquet, L. Minel, G.I. Grigonov, I.N. Martev
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Volume:
161
Year:
1988
Language:
english
Pages:
1
DOI:
10.1016/0040-6090(88)90269-6
File:
PDF, 80 KB
english, 1988
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