Temperature and thickness dependence of the resistivity of thin polycrystalline aluminium, cobalt, nickel, palladium, silver and gold films
J.W.C. De VriesVolume:
167
Year:
1988
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(88)90478-6
File:
PDF, 522 KB
english, 1988