A transmission electron microscopy study of the crystallization of ion-beam-mixed Pd80Si20 amorphous thin films
A.J. Janicki, B.C. Giessen, P.J. GrundyVolume:
167
Year:
1988
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(88)90490-7
File:
PDF, 668 KB
english, 1988