X-ray photoelectron spectroscopy and Rutherford...

Thin Solid Films 1988 Vol. 167; Iss. 1-2

X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry study of anion incorporation in anodically grown films

N. Magnussen, L. Quinones, D.L. Cocke, E.A. Schweikert, B.K. Patnaik, C.V.Barros Leite, G.B. Baptista
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Volume:
167
Year:
1988
Language:
english
Pages:
10
DOI:
10.1016/0040-6090(88)90501-9
File:
PDF, 629 KB
english, 1988
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