Determination of the thickness and distribution of a...

Thin Solid Films 1989 Vol. 178; Iss. 1-2

Determination of the thickness and distribution of a Langmuir-Blodgett film using soft X-ray reflection

A. Momose, Y. Hirai, I. Waki, S. Imazeki, Y. Tomioka, K. Hayakawa, M. Naito
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Volume:
178
Year:
1989
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(89)90347-7
File:
PDF, 245 KB
english, 1989
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