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Temperature, light intensity and microstructure dependence of the refractive index of polycrystalline silicon films
S. Chandrasekhar, A.S. Vengurlekar, V.T. Karulkar, S.K. RoyVolume:
169
Year:
1989
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(89)90702-5
File:
PDF, 325 KB
english, 1989