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A technique for determination of microhardness profiles in thin surface diffusion layers
K. Sridharan, A.M. Redsten, F.J. Worzala, R.A. Dodd, J.R. ConradVolume:
175
Year:
1989
Language:
english
Pages:
1
DOI:
10.1016/0040-6090(89)90851-1
File:
PDF, 287 KB
english, 1989