Surface accumulation and monolayer coverage during grain...

Thin Solid Films 1989 Vol. 174; Iss. part-P1

Surface accumulation and monolayer coverage during grain boundary diffusion in polycrystalline Cu/Ni bilayers

R. Venos, H. Hoffmann
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Volume:
174
Year:
1989
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(89)90876-6
File:
PDF, 292 KB
english, 1989
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