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Characterization of long-periodic layered structures by X-ray diffraction I: A system for small angle and intermediate angle X-ray diffraction using a reflection kratky camera
Yuji Sasanuma, Yukishige Kitano, Akira IshitaniVolume:
190
Year:
1989
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(89)90921-8
File:
PDF, 362 KB
english, 1989