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Nodular growth in thin films: Preparation and transmission electron microscopy characterization in CoCr layers on silicon substrates
R. Mattheis, F. Thrum, H.-J. AnklamVolume:
188
Year:
1990
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(90)90296-p
File:
PDF, 472 KB
english, 1990